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1 Trinh Thanh Thuy, Chonghoon Shin, Cam Phu Thi Nguyen, Kyungsoo Jang, Van Duy Nguyen, Jaehyeong Lee, Vinh Ai Dao, Junsin Yi: Charge Storage Capabilities of (a/nc) Si Embedded in SiOx Matrix and the Influence of Tunneling Layer Thickness of SiO2/(a/nc)Si–SiOx/SiOxNy Stack on the Memory Performances of MIS Structure. JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY 17(5): 3210-3216 (January 2017). [Pub ID : #2787]